J micro or J microTechnology supplies Probe Station and Equipment including Microscopes USB Camera and CCD video systems

Welcome to J microTechnology, Inc.

3744 NW Bluegrass Pl. - Portland - OR - 97229
(503) 614-9509 (Voice) - (503) 531-9325 (FAX)

Specialists in electrical and mechanical test products for advanced semiconductor, medical, and packaged devices.

Products/Services for Probe Stations
Probe Station Success Stories
Resource Library CPW-microstrip Adapter Substrates
Customer Service for RF Microwave MEMS Nanoelectronics Probe Station
What's New with Analytical manual probe station
About Test Cables and J microTechnology also known as J micro

Online Store

Educational Institution Pricing
Special University Lab Packages
&
Student RF Microprobe Stations
Contact
UnivService





Basic Probe Station for DC Parameter testing RF and Microwave Characterization and Modeling

Lab Microprobe Station



Microstrip to CPW Adapter Substrates with Microwave Transister

PP1003 used for
Transistor Test Module

Microstrip to CPW Adapter Substrates with MMIC

PP0513 used for
MMIC Test Module


Probing Equipment for Physical Science

Signup for email or Leave comment!
 

Visited us in Providence 
IMAPS 2008 Exhibition

Visited us in Boston at Booth 914
2009 IEEE IMS MTT-S Exhibition

We are looking for representatives in Europe, Asia and Australia/New Zealand
Please contact us


An Application Note for J microTechnology Products
Precise, Repeatable RF Measurements Using CPW Probes
Free Calibration Software for ANAs
Free Software from VNA Help

        J microTechnology offers accessory products for the electrical test of advanced semiconductor devices and packaging products. The product focus is to supply the necessary accessories to bring the precision of coaxial/coplanar microwave probes to non coplanar test structures through precision low cost thin film network (TFN) "adapters", ProbePoints, and affordable microprobing test fixtures, personal probe stations and manual probe stations. To this end, J microTechnology products offer an unprecedented, for this industry, level of performance and compatibility. We also offer some of the quickest delivery times - Most accessory products are in stock, Personal Probe Stations and Test Fixture and Manual Probe Stations ship typically in 2 weeks, never longer than 6 weeks.

  • Microwave Test Accessories - Thermal chuck adapters, DC needle positioners and needle probes, vision capture systems Calibration Kits, Picoprobes (GGB) 
    • Test Cables - Metrology grade cables for microwave microprobe testing
  • ProbePoint - Precise thin film networks (TFN) adapters for Coplanar waveguide to microstrip circuits and MMIC subassemblies 
    • ProbePoint adapter substrates for Devices - Coplanar waveguide to microstrip circuits ( 5 mil, 10 mil, 15 mil versions)
    • ProbePoint adapter substrates for MMICs - Coplanar waveguide to microstrip circuits with bond wire compensation ( 5 mil version)
    • ProbePoint microstrip transmission line substrates - Precise microstrip circuits for test of packages and multichip MMIC interconnect.
    • Calibrations Substrates - for direct calibration of ProbePoint Adapter Substrates and coplanar picoprobe (GGB)  
    • OSLT Calibrations Kits - "Surrogate Package" calibration standards for surface mount package test fixtures. 

Laboratory Microprobe Station

low cost microprobe station prober shielded guarded chuck cox triax probes MEMS nanotechnology sensors thin film test

LMS-2709
Data Sheet

An extremely low cost RF/Microwave probe station
for research and teaching laboratories
LMS-2709 has a translation stage with 1" x-y travel and z-lift
standard 2" square vacuum chuck
2 or more magnetic mount ball bearing 0.5" travel positioners,
compatible with GGB ECP18, Model 40, Model 7 and Model 10 probes
20X/40X binocular or trinocular microscope
fluorescent light ring illuminator
included vacuum pump
included foam lined storage container.
Up to 4 optional  magnetic mount positioners can be used on the base platten
for four sided probing of test devices to >40 gHz
Optional: DC Needle holder and needles coax or triax probes and shielded guarded chuck
Optional: Temperature controlled chuck

 
 
JR-2745 Manual Probe Station 

Jr-2736 Manual Probe Station for RF Microwave MEMS Nanoelectronic Semiconductor electrical test and probe 

A low cost manual probe station for testing high speed, microwave and RF semiconductors 
with wafer sizes up to 200mm (8")
Magnetic mount or 'bolt on' microwave positioners
4.5" probe card adapter available
South position insert plate available for NSEW probe location

J microTechnology probe stations offer a cost effective platform
for dedicated test systems that require short cables 
such as the Pulsed IV Test System "DiVA" from Accent Optical Technologies
or the Load Pull  Test Modules from Maury Microwave
DiVA 225 Pulsed IV Test System with J microTechnology (J micro) Manual Probe Station and Controlled impedance GGB Industries probes (Model ECP) probe strained silicon GaAs SiC or other high power semiconductor devices

Optional Mezzanine Shelf puts the DiVA Pulsed IV Test System
within 4" cable distance to the probes for enhanced test performance. 
Mezzanine Shelf and 4" cables available from J microTechnology.

We want to serve our customers by making their tasks easier and more productive. 

Contact 

J microTechnology, Inc
 

Your source for Personal Probe Stations, Coplanar and Microstrip Test Fixtures and useful coplanar to microstrip adapter products. 

C. W. Swift and Associates
Southern California - Distributor 

S. M. Electronics
Texas - Distributor 
 

International - Sales and Service

Europe - Sales and Service

Elecsys, LLC
 

zoom















































 





                   J microTechnology - 3744 NW Bluegrass Pl. - Portland - OR - 97229
                                                                                     (503) 614-9509 (V) - (503) 531-9325 (F)